Acronyms

► NDT = Non-Destructive Testing

► UT = Ultrasonic Technology

► FFT = Fast Fourier Transform

► A-scan = Amplitude versus time (single signal)

► B-scan = Amplitude versus time (depth) and sweep displacement (one axis) ~ side view

► C-scan = Amplitude versus sweep displacements (two axes) ~ top view

► FPGA = Field-Programmable Gate Array

Ultrasonic Phased-Array Solutions

Updated

March 12, 2008

Nondestructive Testing