Acronyms
► NDT = Non-Destructive Testing
► UT = Ultrasonic Technology
► FFT = Fast Fourier Transform
► A-scan = Amplitude versus time (single signal)
► B-scan = Amplitude versus time (depth) and sweep displacement (one axis) ~ side view
► C-scan = Amplitude versus sweep displacements (two axes) ~ top view
► FPGA = Field-Programmable Gate Array
